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12 inch Olympus wafer inspection system
There are mainly two types of 12 inch Olympus wafer inspection systems, namely AL120-LMB12-LP and AL120-LMB12-F. The Olympus wafer inspection system c
Product details

The main features of the 12 inch Olympus wafer inspection system are:

● Sturdy, reliable, and safe transmission

The 12 inch Olympus wafer inspection system continues the robustness, reliability, and safety of the previous generation model, capable of safely and reliably transporting 300mm wafers, as well as thin and Warped wafers.

● Ergonomic design, easy to operate

The 12 inch Olympus wafer inspection system has a freely adjustable inspection mode, and its design takes into account the operability in post-processing, with particular emphasis on the ease of equipment operation. Corresponding to two models of FOUP (Load Port) and FOSB respectively.

The optimization of macroscopic observation positions and centralized arrangement of operating units in the 12 inch Olympus wafer inspection system have improved the operability of the equipment.

Automatic 300mm wafer inspection system AL120-12 technical specifications12寸奥林巴斯晶圆检查系统AL120-LMB12-LP/AL120-LMB12-F

model

AL120-LMB12-LP

AL120-LMB12-F

Wafer size

300 mm (SEMI M1.15 t=775 μ m) optional: 200 mm

Number of card boxes

Single box (for both loading and unloading purposes)

Card box height setting

900 mm

Loading port

have

not have

Transportation sequence

Surface macro, internal macro, and microscopic examination

check mode

All inspections, sampling inspections

Wafer calibration

Non contact center ring

Wafer handling method

Vacuum adsorption mechanical handling

Applicable microscope

Semiconductor Inspection Microscope MX61L

application environment

AC100~120 V,220~240 V,3.0/1.7 A,50/60 Hz , Vacuum -67~-80 Kpa

stage

XY manual suction stage with XY coarse/fine adjustment and 360 degree rotation mechanism

Weight (excluding microscope)

About 360 kg

About 270 kg

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