performance index

Working band: 190nm-900nm

Wavelength accuracy: ≤± 0.5nm

Wavelength repeatability: ≤ 0.3nm (unidirectional)

Spectral bandwidth: 0.2nm, 0.4nm, 0.7nm, 1.4nm, 2.4nm, 5.0nm

Baseline stability: ≤ 0.004Abs/30min

Background correction capability:>30x

Product Features

1. Good baseline stability: The carefully designed dual beam system can automatically compensate for light source drift, and the lamp can analyze samples immediately without preheating, making it a user instrument for analyzing multiple elements and emergency analysis samples.

2. High precision analysis: A uniquely designed thin beam passes through the flame with a stable baseline, ensuring high-precision analysis and measurement with low detection limits.

3. Instrument optical path: Using a total reflection system, after one element is illuminated, all elements are imaged in the * position.

4. Safe and reliable gas path system: With unique fast gas conversion and safety protection devices, the analysis elements can be expanded from more than 30 to over 60, and can be used for both air acetylene flame analysis and nitrous oxide acetylene flame analysis.

5. Under the Windows environment, instrument conditions and data can be stored or accessed. Can display and print: (1) Instrument and measurement conditions; (2) The data in 'measurement'; (3) sample concentration report, which can summarize the concentration of elements (up to 8 elements) measured in a batch of samples (up to 100), can be saved as * for future reference and retrieval.

6. Provide linear, nonlinear, and linear calibration methods to calibrate up to 10 standard samples. After the calibration is completed, alternate between drawing linear and nonlinear calibration curves for judgment and selection.

7. The built-in statistical program can calculate the mean, standard deviation, relative standard deviation, and correlation coefficient, thereby achieving monitoring and improving the measurement accuracy of the instrument.

8. Print standard curves, atomic absorption peaks, spectral line profiles, and data using a printer.