Instrument usage:
Batou ® BLD-5800 Microscope Image Particle Size Analysis Microscope System. By adopting an excellent infinite optical system and modular functional design concept, the system can be easily upgraded to achieve polarization observation, dark field observation, and other functions. The compact and stable high rigidity body fully reflects the seismic requirements of microscopic operations. Ideal design that meets ergonomic requirements, making operation more convenient, comfortable, and spacious. Suitable for microscopic observation of metallographic structure and surface morphology, it is an ideal instrument for research in metallurgy, mineralogy, precision engineering, and other fields.
Performance characteristics:
▲ Large field of view eyepiece, field of view diameter22mmThe field of view is large and flat.
▲ Light and dark field observation (choose dark field type), modular design, easy switching between light and dark fields.
▲ The infinite high beam path system adopts an infinite far flat field achromatic objective lens, which has excellent imaging effect.
▲ Ergonomic design, unique dial style fine adjustment (right-hand).
▲ Translucent and reflective lighting can observe opaque, semi transparent, and transparent objects.
▲ Reflective lighting with adjustable polarizing device, capable of360Rotate in degrees.
Microscope configuration:
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Technical Specifications |
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brand |
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eyepiece |
Broad VisionWF10X(Number of fields of view Φ22mm) |
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host |
Sanmu host,100%Spectral (photography device) |
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Long Working Distance objective |
Infinite flat field chromatic aberration reduction |
PL L5X/0.12Working distance:26.1 mm |
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PL L10X/0.25Working distance:20.2 mm |
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PL L40X/0.60Working distance:3.98 mm |
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PL L60X/0.70Working distance:3.18 mm |
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Eyepiece tube |
30˚tilt,Pupil distance adjustment range53~75mm. |
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focusing system |
Coarse micro coaxial focusing,Equipped with locking and limiting devices,Micro grid value:2Mm. |
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converter |
five-hole(Internal positioning of inward ball) |
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stage |
Double layer mechanical mobile stage,Overall dimensions:210mmX140mm,Mobile range:63mmX50mm |
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Falling light illumination system |
6V30WHalogen lamp, adjustable brightness |
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Built in field of view light barrier, aperture light barrier, color filter conversion device, push-pull analyzer and polarizer |
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Transmissive lighting system |
Abbe spotlightNA.1.25Adjustable up and down |
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Built in field of view light bar in the light collecting mirror |
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6V30WHalogen lamp, adjustable brightness |
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imaging system |
1000Ten thousand pixel imaging system |
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Introduction to Analysis System:
1 Test scope:1-3000Mm.
2 Magnification factor:4000Doubling (combining optical and electronic amplification).
3 Maximum resolution:0.1Mm/Pixel.
4 ※ Digital camera:1000Ten thousand pixelsUSB3.0.
5 Repetitive error ≤3%(Depending on the sample condition and image quality) .
6 Accuracy error ≤3%(Depending on the sample condition and image quality) .
7 Scale accuracy:10um.
8 Automatic segmentation speed:>1In seconds.
9 Segmentation success rate:< 93%. (Depending on the sample condition and image quality)
10 Operating System:WinXP/Win7/Win8/Win10.
11 Interface method:USB3.0(Compatible)USB2.0)Method.
12 The software has particle positioning function.
13 Software functions: image enhancement, image overlay, local extraction, fixed magnification, contrast adjustment, automatic image analysis (batch analysis), etc.
14 Software analysis item: automatic calibration of particle size, automatic segmentation, with the ability to merge multiple images and analyze them simultaneously. Capable of measuring aspect ratio, roundness, and simple particle size analysis.
15 Data output items: particle size distribution curve and table, roundness, curve, perimeter, area, diameter, etc., including raw parameters (including sample information, test information), analysis data (including interval distribution, cumulative distribution, average diameter, aspect ratio, and aspect ratio distribution), distribution graphics (interval distribution histogram and cumulative distribution curve, etc.), specific surface area, individual particles, and particle groups.



Instrument usage: Batou ® BLD-5800 Microscope Image Particle Size Analysis Microscope System. By adopting an excellent infinite optical system and modular functional design concept, the system can be easily upgraded to achieve polarization observation, dark field observation, and other functions. The compact and stable high rigidity body fully reflects the seismic requirements of microscopic operations. Ideal design that meets ergonomic requirements, making operation more convenient, comfortable, and spacious. Suitable for microscopic observation of metallographic structure and surface morphology, it is an ideal instrument for research in metallurgy, mineralogy, precision engineering, and other fields. Performance characteristics: ▲ Large field of view eyepiece, field of view diameter22mmThe field of view is large and flat. ▲ Light and dark field observation (choose dark field type), modular design, easy switching between light and dark fields. ▲ The infinite high beam path system adopts an infinite far flat field achromatic objective lens, which has excellent imaging effect. ▲ Ergonomic design, unique dial style fine adjustment (right-hand). ▲ Translucent and reflective lighting can observe opaque, semi transparent, and transparent objects. ▲ Reflective lighting with adjustable polarizing device, capable of360Rotate in degrees.
Microscope configuration:
Technical Specifications brand eyepiece Broad VisionWF10X(Number of fields of view Φ22mm) host Sanmu host,100%Spectral (photography device) Long Working Distance objective Infinite flat field chromatic aberration reduction PL L5X/0.12Working distance:26.1 mm PL L10X/0.25Working distance:20.2 mm PL L40X/0.60Working distance:3.98 mm PL L60X/0.70Working distance:3.18 mm Eyepiece tube 30˚tilt,Pupil distance adjustment range53~75mm. focusing system Coarse micro coaxial focusing,Equipped with locking and limiting devices,Micro grid value:2Mm. converter five-hole(Internal positioning of inward ball) stage Double layer mechanical mobile stage,Overall dimensions:210mmX140mm,Mobile range:63mmX50mm Falling light illumination system 6V30WHalogen lamp, adjustable brightness Built in field of view light barrier, aperture light barrier, color filter conversion device, push-pull analyzer and polarizer Transmissive lighting system Abbe spotlightNA.1.25Adjustable up and down Built in field of view light bar in the light collecting mirror 6V30WHalogen lamp, adjustable brightness imaging system 1000Ten thousand pixel imaging system

Introduction to Analysis System:
1 Test scope:1-3000Mm.
2 Magnification factor:4000Doubling (combining optical and electronic amplification).
3 Maximum resolution:0.1Mm/Pixel.
4 ※ Digital camera:1000Ten thousand pixelsUSB3.0.
5 Repetitive error ≤3%(Depending on the sample condition and image quality) .
6 Accuracy error ≤3%(Depending on the sample condition and image quality) .
7 Scale accuracy:10um.
8 Automatic segmentation speed:>1In seconds.
9 Segmentation success rate:< 93%. (Depending on the sample condition and image quality)
10 Operating System:WinXP/Win7/Win8/Win10.
11 Interface method:USB3.0(Compatible)USB2.0)Method.
12 The software has particle positioning function.
13 Software functions: image enhancement, image overlay, local extraction, fixed magnification, contrast adjustment, automatic image analysis (batch analysis), etc.
14 Software analysis item: automatic calibration of particle size, automatic segmentation, with the ability to merge multiple images and analyze them simultaneously. Capable of measuring aspect ratio, roundness, and simple particle size analysis.
15 Data output items: particle size distribution curve and table, roundness, curve, perimeter, area, diameter, etc., including raw parameters (including sample information, test information), analysis data (including interval distribution, cumulative distribution, average diameter, aspect ratio, and aspect ratio distribution), distribution graphics (interval distribution histogram and cumulative distribution curve, etc.), specific surface area, individual particles, and particle groups.



