Four probe conductivity tester, four probe tester, voltage drop tester, tap density meter, bulk density tester, high temperature resistivity tester, surface resistance tester, surface resistivity tester, block resistance tester, semiconductor resistivity tester, tap density tester, volume resistance tester, volume density tester
FT-340 series dual electric four probe square resistance resistivity tester
This instrument adopts the four probe dual electric measurement method and is suitable for production enterprises, universities, and research departments. It is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials. This instrument is equipped with various measuring devices to test different materials. LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Adopting high-precision AD chip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Optional: Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports; This instrument adopts a 4.3-inch large LCD screen display, which simultaneously displays resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity. Different testing fixtures can be configured to meet the testing requirements of different materials. Testing fixtures can be selected according to product and testing project requirements
The dual electric measurement digital four probe tester uses linear or square four probe dual position measurement. The instrument design complies with the physical testing method standards for single crystal silicon and refers to the American A S. T.M standard. By using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed using dual electrical measurements. This automatically eliminates the influence of sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results. Compared with single electrical measurement linear or square four probe probes, it greatly improves the accuracy, especially suitable for testing micro areas with oblique four probe probes.
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Specification and model
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FT-341
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FT-342
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FT-343
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FT-345
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FT-346
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FT-347
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1.Block resistance range
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10-4～2×105Ω/□
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10-4～2×103Ω/□
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10-3～2×105Ω/□
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10-3～2×103Ω/□
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10-2～2×105Ω/□
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10-2～2×103Ω/□
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2.Range of resistivity
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10-5～2×106Ω-cm
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10-5～2×104-cm
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10-4～2×106Ω-cm
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10-4～2×104-cm
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10-3～2×106Ω-cm
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10-3～2×106Ω-cm
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3.Test current range
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0.1μAμA0μA，
100µA，1mA，
10mA，100 mA
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1μA，10μA，
100µA，1mA，
10mA，
100 mA
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0.1μAμA，
10μA，
100µA，
1mA，
10mA，
100 mA
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1μA，10μA，
100µA，
1mA，
10mA，
100 mA
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0.1μA，1μA，
10μA，
100µA，1mA，
10mA，
100 mA
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1μA，10μA，
100µA，1mA，
10mA，
100 mA
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4.current accuracy
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±0.1%reading
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±0.2%reading
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±0.2%reading
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±0.3%reading
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±0.3%reading
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±0.3%reading
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5.Resistance Accuracy
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≤0.3%
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≤0.3%
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≤0.3%
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≤0.5%
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≤0.5%
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≤0.5%
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6.display reading
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Large screen LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness Conductivity
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7.testing mode
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Dual electric measurement
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8.Working power supply
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input: AC 220V±10% 50Hzpower waste:<30W
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9.Complete machine uncertainty error
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≤3%(Standard Sample Results)
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10.Selection function
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choose and buy1.pcSoftware; choose and buy2.Square probe; choose and buy3.Linear probe; choose and buy4.test platform
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