Nikon Instruments (Shanghai) Co., Ltd
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INEXIV VMA series
The iNEXIVVMA series is designed to meet the automation measurement needs of mechanical components, electronic products, molds, injection molding, met
Product details

INEXIV VMA series

Specially designed to meet the automation measurement needs of mechanical components, electronic products, molds, injection molding, metal stamping, rubber products, medical equipment, and more.

VMA-2520 / VMA-4540 / VMA-6555

iNEXIV VMA2520

Suitable for measuring small electronic products (within 250X200X200mm).

iNEXIV VMA4540

Suitable for measuring medium-sized products (within 450X400X200mm) and multiple measurements of the same product.

iNEXIV VMA6555

Suitable for measuring large products (within 650X550X200mm) and multiple measurements of the same product.

Key Features:

Easy to operate, wide field of view, clear images

Ensure a maximum field of view of 13mm x 10mm on the stage, with a 5-level 10X optical zoom to confirm fine parts of the product.

long working distance

The height from the objective lens to the focal position is ensured to be 73.5mm, and there is no need to worry about touching the objective lens when measuring large step differences or high top positions. It can also exert its power in measuring the depth of small deep holes.

High repeatability autofocus

There are two focusing methods: high-speed and high-precision image autofocus and optional laser autofocus.

Three angles (37 º, 55 º, 75 º) with 8-segment LED lighting, clearly presenting blurry boundaries

The 8-segment LED inner and outer ring lighting device can provide optimal lighting conditions. Depending on the shape of the product, the most suitable light quantity and illumination direction can be selected to quickly capture subtle boundaries.

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Laser AF (optional)

Specially designed for flat surface measurement, it can achieve very high repeatability accuracy at all image magnifications.

*When using laser AF, the working distance of the objective lens is 63mm.

Intelligent retrieval function

Uneven arrangement of workpieces and differences in detection positions caused by individual differences of workpieces can be automatically corrected through pattern matching function, thereby eliminating possible measurement program execution errors caused by this.

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