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Keithley 2400/2420/2440 Digital Source Table
Keithley 2400/2420/2440 digital source meter Main features: integrates the functions of 5 instruments (IV source, IVR measurement) 6 modes: 20W~100W D
Product details

Keithley 2400/2420/2440 Digital Source Table

Main characteristics

  • Integrating the functions of 5 instruments (IV source, IVR measurement)
  • 6 modes: 20W~100W DC, 1000W pulse, 1100V~1 μ V, 10A~10pA
  • Source and trap (4 quadrants) operation
  • 0.012% basic measurement accuracy (6-and-a-half bit resolution)
  • 2-wire, 4-wire, and 6-wire remote voltage sources and measurement sensing
  • 1700 readings per second (4 and a half bit resolution), via GPIB
  • Using/disabling comparator for quick sorting/sorting
  • Provide high-speed sensing line contact inspection function
  • Programmable DIO port for automation/processing programs/probe control
  • Standard SCPI GPIB, RS232, and Jishili trigger link interfaces
  • Jishili LabTracer 2.0 I-V Curve Tracking Application Software (Download)

Typical applications

Equipment:

  • discrete-semiconductor device
  • Passive components
  • Transient suppression device
  • IC、RFIC、MMIC
  • Laser diode, laser diode module LED、 photodetector
  • Circuit protection devices: TVS, MOV, fuses, etc
  • Air bag
  • Connectors, switches, relays


Testing:

  • leakage of electricity
  • Low voltage/resistance
  • LIV
  • IDDQ
  • I-V characteristic analysis
  • Isolation and printed line resistance
  • temperature coefficient
  • Forward voltage, reverse breakdown, leakage current
  • DC Parameter Testing
  • DC power supply
  • HIPOT
  • Example of insulation withstand voltage test sequence


The advantages of compact integrated instruments
By connecting the source and measurement circuit in a single device, these instruments canProvide a system that is superior to building individual sources and measuring instruments. For example,They greatly shorten the time required for testing station development, establishment, and maintenanceAt the same time, it reduces the overall cost of purchasing the system. By removing and usingThe complex synchronization and connection issues related to multiple instruments simplify testingThe process itself. Moreover, the compact half rack size saves valuable "space" for testing racks or test benches.


Integrating 5 instrument functions (IV source, IVR measurement)
The precise coupling characteristics of source measuring instruments have many advantages over discrete instruments. For example, it has shorter testing time, reduces GPIB traffic, and simplifies remote programming interfaces. It also protects the tested equipment from damage in occasional overload, thermal runaway, and other situations. Both the current source and voltage source can be set to read back to maximize the measurement integrity of the device. If the read back reaches the limit of programmable tolerance, the source is clamped at this limit, providing error protection.

I-V characteristic analysis
All digital source tables provide 4-quadrant operation. When working in quadrants 1 and 3, it serves as a power source to output power to the load. When working in the second and fourth quadrants, it acts as a trap (load) to absorb energy. Voltage, current, and resistance can be measured during source or trap operation.


Automation to improve speed
Jishili digital source meters have improved the efficiency of production testing. It can measure while providing voltage or current sources without changing connections, making it suitable for reliable operation in uninterrupted production environments. In order to meet the throughput requirements for production applications, digital source meters have many built-in functions that enable them to run complex test sequences without the need for slower computer control or GPIB communication.


Standard scanning and customized scanning
The scanning scheme uses automated hooks to greatly accelerate testing. The three basic scanning waveforms can be set to single event or continuous operation, making them very suitable for I/V, I/R, V/L, and V/R characteristic analysis.

-Linear staircase scanning: using equal linear steps from the starting level to the ending level
-Logarithmic staircase scanning: Scanning in proportion to the specified number of steps per ten units
-Customized scanning: supports setting up dedicated scanning by specifying the number of measurement points and the output level of each point
-Up to 1700 readings per second (4 and a half bit resolution), to GPIB bus
-5000 readings with a resolution of 6 and a half bits can be stored in non-volatile buffer memory


Built in test sequencer (source memory list)
The source storage list provides faster and more convenient testing, allowing you to set up and execute up to 100 different tests without PC intervention.
-Store up to 100 instrument configurations, each containing source settings, measurement settings, pass/fail criteria, and more.
-Pass/fail limit test speed up to 500 μ s/test point
-The onboard comparator eliminates the delay that occurs when sending data to the computer for analysis
-Built in, user-defined mathematical functions are used to calculate and derive parameters

Digital I/O interface
The digital I/O interface can connect digital source tables to many popular component processing programs, including Aetrium, Aeco, and Robotronics. Other functions of this interface include:
·Compact system integration for applications such as sorting and sorting
·Built in component processing program interface
·Test start and test end signals
·5V, 300mA power supply
·Optional extender accessory (2499-DIGIO type) adds 16 digital I/O lines


Trigger link interface
All digital source tables include Jishili's proprietary trigger link interface, which can establish high-speed and seamless communication with many Jishili and other instruments. For example, using trigger link interfaces to connect digital source meters and 7000 series switch systems to achieve a complete multi-point testing solution. During high-speed testing sequences independent of computers and GPIB, the 7000 series switch system can be controlled by a digital source meter by triggering the link.


Optional contact inspection function
Before the automatic testing sequence begins, the contact check function can quickly and easily verify whether the connection is good. This eliminates measurement errors and inaccurate product defects caused by contact fatigue, damage, contamination, looseness or connection interruption, relay failure, etc. Some of the performance features of this feature are as follows:
·350 μ s verification and notification processing time
·The output of the digital source meter automatically shuts down after an error and is reactivated after confirming good contact, thereby protecting the tested device from damage and protecting the controller from potential security threats.
·3 pass/fail thresholds: 2 Ω, 15 Ω, and 50 Ω
·During the working process, no energy passes through the tested device
·Enable from the front panel or remotely via GPIB
·3 fault notification methods

Unique 6-wire resistance measurement method
The digital source meter can perform standard 4-wire, split Kelvin, and 6-wire, protected resistance measurements and can be configured as a constant current or constant voltage method. 6-line measurement method:
·In addition to 4-wire sensing and source testing lines, protective and shielded sensing lines are also used.
·Locking the parallel current path, when measuring the isolation of the tested component in a resistor bank or hybrid circuit
·Allow users to easily configure and plot data using 2400 series source tables, enabling easy analysis of the characteristics of two, three, and four terminal devices


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