Shenzhen Yijie Testing Technology Co., Ltd., abbreviated as GBIT, specializes in providing semiconductor wafer level testing, packaging processes, and inspection equipment, and focuses on providing customers with complete system integration services. The company has long-term cooperation with multiple advanced semiconductor equipment companies abroad, and has introduced equipment and technology from world-class manufacturers such as the United States, Europe, Japan, and Taiwan. At the same time, it is committed to supplying domestically produced independently controllable semiconductor equipment, integrating domestic user needs, creating a stable supply chain for domestic wafer level on chip testing and semiconductor packaging process system integration, and providing "tailor-made" customized transformation services. Yijie Testing was established in 2011, headquartered in Shenzhen, and has business outlets in Beijing, Nanjing, Chengdu and other places. Our clients mainly include influential research institutes, universities, and enterprises with research and development capabilities in China. The company has a professional technical team with rich experience in the field of semiconductor testing. This team can not only provide customers with high-quality and comprehensive solutions, but also offer systematic and localized transformation services. The equipment involved in the company's business includes various microwave and RF devices, accessories (MPI RF probes, probe holders, Maury microwave calibration parts, coaxial calibration and waveguide calibration parts, network analyzer port cables, RF microwave connectors, precision attenuators, Maury metrology adapters), system integration, and testing instruments. The company's technical services include various on chip testing system integration solutions, packaging microassembly and process inspection systems, microwave simulation modeling, and other services. Among them, the integration solution service for on-chip testing systems is one of our major features. The company keeps up with the trend and has various on-chip integration technologies for different probe stations. With years of industry experience and technical accumulation, we can provide customers with testing and measurement probe station system integration solutions for applications such as semiconductor wafers, materials, optoelectronics, and packaging. The existing solutions mainly include semiconductor microwave/terahertz millimeter wave high-frequency measurement on chip solutions, optoelectronic device on chip testing, EMMI testing in high and low temperature environments, 5G system metrology testing, silicon light on chip measurement, X-ray irradiation total dose on chip testing system, material electrical property testing system solutions, ESD/CDM/TLP testing system solutions, radar and communication countermeasure testing systems, etc. The main probe station products include semi-automatic probe stations, vacuum probe stations, terahertz probe stations, silicon light probe stations, high and low temperature probe stations, micro light microscopes, ultra-low temperature probe stations, optoelectronic probe stations, irradiation probe stations, RF probe stations, fully automatic probe stations, manual probe stations, etc. Shenzhen Yijie Testing has outstanding professional performance in the fields of semiconductor testing and microwave in China. The company has signed cooperation agreements with multiple domestic and foreign strong semiconductor device and precision testing brand manufacturers. The leading brands include MPI, a high-end advanced probe station system manufacturer; MAURY, a world-class manufacturer of microwave components and testing systems; KEYSIGHT, a leading global manufacturer of measuring instruments; Modelithics, a world leading provider of microwave simulation models and modeling services; HANWA ESD/CDM/TLP testing leading equipment in Japan; TOTOKU cables from Japan, as well as NORDSON packaging process testing equipment. Yijie Testing not only provides hardware services, but also software design, which can be compatible with multiple systems for better operation. With the development and popularization of 5G wireless communication and the Internet of Things, as well as the continuous development of military systems such as radar, aerospace, and precision guidance. The demand for RF millimeter wave integrated circuits will greatly increase, while the requirements for quality and product diversity will also become increasingly high. RF fully automatic on-chip testing is a very important process in compound integrated circuit production testing (WAT testing and CP testing). The automatic on chip testing system software of Yijie Testing has been well applied in enterprises and research institutions such as China Electronics 55 Institute, China Electronics 13 Institute, Nanjing University, Zhejiang University, and Tianbing Electronics. The technical level of this software is at the level of domestic software and has been recognized and praised by customers.